Atomic-force microscopy

Results: 458



#Item
71Materials science / Intermolecular forces / Adhesives / Packaging materials / Microscopy / Epoxy / Atomic force microscopy / Carbon-fiber-reinforced polymer / AFM probe / Chemistry / Science / Composite materials

Microsoft PowerPoint - Effect_of_Surface_Contamination_on_Composite_Bond_Integrity_and_Durability-McDaniel.pptx

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Source URL: www.jams-coe.org

Language: English - Date: 2015-02-11 17:04:11
72Scanning probe microscopy / Nanolithography / Atomic force microscopy / Scanning electron microscope / Microscopy / Electron microscope / Nanoimprint lithography / Scientific method / Science / Electron microscopy

inlinenano-commercial-applications-SO.indd

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Source URL: www.icn.cat

Language: English - Date: 2015-04-16 04:16:19
73Microscopy / Fluorescence / Scanning probe microscopy / Spectroscopy / Intermolecular forces / Optical microscope / Microscope / Atomic force microscopy / Fluorescence microscope / Chemistry / Science / Scientific method

Apertureless Near-Field Optical Microscopy for Fluorescence Imaging Thesis by Guillaume Lessard

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Source URL: thebigone.stanford.edu

Language: English - Date: 2013-02-25 13:14:15
74Electron microscopy / Microscopes / Microscopy / Magnetic force microscope / Focused ion beam / Electron microscope / Scanning electron microscope / Optical microscope / Atomic force microscopy / Scientific method / Science / Scanning probe microscopy

Types
of
Microscopy
 Type
 Probe
 Technique


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Source URL: teachers.stanford.edu

Language: English - Date: 2009-07-29 14:10:48
75Microscopes / Microbiology / Intermolecular forces / Atomic force microscopy / Scanning tunneling microscope / Optical microscope / Scanning probe microscopy / Scientific method / Science

Nanoscale Images • All the images in these slides were created using scanning tunneling microscopes (STMs) or atomic force microscopes (AFMs). • These images are computer generated from measurements of electric cur

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Source URL: teachers.stanford.edu

Language: English - Date: 2009-07-29 14:10:46
76Microscopy / Atomic force microscopy / Microscope / Scanning tunneling microscope / Magnetic force microscope / Nanotechnology / Optical microscope / Electron microscope / Gerd Binnig / Science / Scanning probe microscopy / Scientific method

Scanning Probe Microscopy What are scanning probe microscopes? Scanning probe microscopes (SPMs) are a family of tools used to make images of nanoscale surfaces and structures, including atoms. They use a physical prob

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Source URL: teachers.stanford.edu

Language: English - Date: 2009-07-29 14:10:35
77Intermolecular forces / Chemistry / Atomic force microscopy / Image scanner / Park Systems / Piezoelectricity / X-ray computed tomography / Scanning electron microscope / Scientific method / Science / Scanning probe microscopy

Surface Topography Considerations of Patterned Sapphire Substrates for Blue/Green light Emitting Diode General Considerations Nitride-based semiconductor materials (i.e., GaN, InGaN, AlN) have attracted considerable atte

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Source URL: www.nanowerk.com

Language: English - Date: 2011-11-12 18:00:00
78Chemistry / Atomic force microscopy / Microscopy / Cantilever / Scanning tunneling microscope / Magnetic force microscope / AFM probe / Scanning probe microscopy / Science / Scientific method

PDF Document

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Source URL: pfwww.kek.jp

Language: English - Date: 2012-01-30 04:32:46
79Scanning probe microscopy / Nanotechnology / Intermolecular forces / Atomic force microscopy / Microscopy / Cantilever / Electron / Core electron / Vibrational analysis with scanning probe microscopy / Physics / Science / Chemistry

Photon Factory Activity Report 2004 #22 Part BSurface and Interface 7C/2003G301 A Challenge to XANAM- a New Nanoscale Chemical Mapping Microscopy

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Source URL: pfwww.kek.jp

Language: English - Date: 2010-01-05 10:31:29
80Science / Emerging technologies / Nanoelectronics / Nanowire / Magnetic resonance force microscopy / Nanotechnology / Atomic force microscopy / National Institute of Standards and Technology / Spintronics / Physics / Electromagnetism / Scanning probe microscopy

THE CNST NEWS SUM M ER 2012

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Source URL: nist.gov

Language: English - Date: 2012-08-09 15:10:43
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